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Spot-Profile-Analysis LEED is the perfect tool for the thorough analysis of defect structures on single crystal surfaces. Designed for the ultimate resolution in k-space by Prof. Henzler at the University of Hannover, it is exclusively manufactured by Omicron. The technique enables precise quantitative analysis of lateral and vertical lattice constants, terrace/islands size and heigth distribution, ordering parameters in phase transitions etc. Heart of the SPA LEED is an octopole which enables the scanning of the diffracted beam over a detection assembly, thus improving the signal to noise ratio and resolution compared to conventional, screen and camera based systems.
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