Photoemission Electron Microscope with integral sample stage for unsurpassed stability and precise sample positioning via remote controlled piezo drives.
The in-situ variable contrast aperture and the stigmator/deflector allow the power of PEEM to be fully exploited in laboratory and synchrotron applications. Topography contrast, work function contrast, chemical contrast and magnetic contrast can be used for surface sensitive real-time imaging of any reasonably flat and conducting surface.
|
