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The MULTIPROBE XP is a dual-chamber surface science UHV system with a large multi-technique analysis chamber for electron spectroscopy and UHV scanning probe microscopy, and a separate sample preparation chamber with FEL. The preparation chamber in the MULTIPROBE XP offers extended sample preparation including sample sputtering, heating and thin film growth with in-situ characterisation by LEED or RHEED in the MULTIPROBE XP.
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