The PEEM can be utilised as a tool for high resolution diagnosis of the spot shape of a synchrotron radiation beam. This method provides an accurate measure of the peak profile of small spots which are very difficult to measure using other techniques. The experiment has been performed at the Beamline U49/1 SGM, (BESSY II (Berlin). A carbon coated sample (hard disk) was positioned into the beam and imaged using the FOCUS PEEM. A spot size of 30µm (hor.) was measured.
|
