The versatility of PEEM (Photoemission Electron Microscope) for topographical, chemical and magnetic contrast imaging at high resolution has already been demonstrated in many laboratory and synchrotron applications [1].
The high performance electron optics and the extraordinarily high mechanical stability of the integral sample stage are key factors for the high resolution recently demonstrated with the FOCUS IS-PEEM.
A gold mesh (a = 1.64 µm) served as a test sample. The experiment was carried out using a conventional high pressure mercury lamp for threshold emission of photoelectrons. Light incidence was from the upper right, as can be seen from the slight enhancement of edges opposing the incident light beam.
In a similar experiment the size of individual points on the surface of the mesh was determined and a half width of 18 nm was found. A separation of 25 nm between two individual points is sufficient, in order that these can be distinguished by an intensity drop down to 80% of the peak intensity. |
