Micro-channelplate
Topographic contrast from a micro-channelplate
using a laboratory source (mercury pressure lamp, E = 4.9 eV)

 
This result has been obtained with :
FOCUS IS-PEEM

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PEEM
PEEM/ µPES: Multicrystalline Silicon (mcSi) PEEM/ µPES: Multicrystalline Silicon (mcSi)
PEEM/µNEXAFS: Multicrystalline Silicon (mcSi) PEEM/µNEXAFS: Multicrystalline Silicon (mcSi)
PEEM/ µPES: Energy resolution tested at the U125/ 1- PGM Beamline at BESSY- II PEEM/ µPES: Energy resolution tested at the U125/ 1- PGM Beamline at BESSY- II
Imaging High-Pass Energy Filter Imaging High-Pass Energy Filter
Magnetic domains Magnetic domains
Chem. contrast of magnetite on MgO Chem. contrast of magnetite on MgO
Laboratory UPS with PEEM MICROANALYSER and HIS 13 High Intensity UV Source Laboratory UPS with PEEM MICROANALYSER and HIS 13 High Intensity UV Source
Pt/Co/Pt Multilayers on Si Pt/Co/Pt Multilayers on Si
Spectromicroscopy and UPS Spectromicroscopy and UPS
FOCUS PEEM for synchrotron beam diagnosis FOCUS PEEM for synchrotron beam diagnosis
Orbital mapping of carbon-pi* Orbital mapping of carbon-pi*
Surface Sensitive Microscopy Surface Sensitive Microscopy
Micro-channelplate Micro-channelplate
Gold mesh on chromium Gold mesh on chromium
Magnetic Flux-closure Magnetic Flux-closure
Magnetic Coupling in Ni/Co/Cu(100) Magnetic Coupling in Ni/Co/Cu(100)
Pd Microstructures on Si Pd Microstructures on Si
Graphite inclusions in cast iron Graphite inclusions in cast iron
PEEM+IEF: Fermi surface of Cu(001) PEEM+IEF: Fermi surface of Cu(001)
TOF PEEM TOF PEEM