PEEM image taken at an excitation energy of 95 eV.
PEEM imaging and spectroscopic micro-spot analysis of Pt/Co/Pt multilayers on Si.
Spectroscopy of selected areas of the PEEM image demonstrates different chemical composition of untreated (a) and etched (b) Pt/Co surface.
Schematic diagram of the examined surface in section (top) and plan (bottom)
Reference :
O. Schmidt, Ch. Ziethen, G.H. Fecher, M. Merkel, M. Escher, D. Menke, U. Kleineberg, U. Heinzmann, G. Schoenhense :
Chemical Microanalysis by Selected-Area ESCA using an Electron Energy Filter in a Photoemission Microscope;
J. Electr. Spectr. Rel. Phenom. 88-91, 1009-1014 (1998).
Sample courtesy of: M. Huth, University of Mainz
