The video shows an STM constant height image of the reconstructed Si(111)7x7 surface taken at an imaging frequency of 12 frames/s. The adatoms of the faulted and unfaulted half of the unit cell, the corner holes as well as some adsorbates can clearly be identified. During scanning the x- and y-offset position was frequently modified to enhance the effect of fast scanning.
Image distortions discernible at the left side of the image are caused by creeping effects of the scanner.
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